Onto Innovation launches Iris G2 metrology system

Onto Innovation announced the launch of the Iris G2 system, a single platform film metrology system for common and critical films, with first shipment scheduled for Q1 2025.

“The Iris G2 system offers a flexible, compelling cost of ownership metrology solution for ultra-thin multilayer films measuring 10Å to 50Å.”businesswire.com

• 1 source
• businesswire.comOnto Innovation Receives Volume Purchase Agreement from a Leading DRAM Manufacturer for Metrology Product SuiteInvestor RelationsJan 14, 2025

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