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Aehr Test Systems has received an initial production order from a top-tier automotive semiconductor supplier for a FOX-XP wafer level test and burn-in system for testing GaN power devices. The system is scheduled to ship immediately.
“We are thrilled to receive this initial production purchase order, signaling their commitment to move forward with volume production wafer level burn-in of their GaN devices on our FOX-XP platform.”powersemiconductorsweekly.com
Summarized from public sources; check the original articles before acting on it.