# Onto Innovation launches Iris G2 metrology system

Onto Innovation announced the launch of the Iris G2 system, a single platform film metrology system for common and critical films, with first shipment scheduled for Q1 2025.

- Type: Product launch
- Announced: 2025-01-14
- Status: announced
- Products: Iris G2 thin film metrology system
- Sectors: [Semiconductors and Industrial Electronics](https://endata.com/sectors/semiconductors-electronics.md)

## Companies

- [Onto Innovation](https://endata.com/companies/59496.md)

## Sources

- [businesswire.com](https://www.businesswire.com/news/home/20250114497099/en/Onto-Innovation-Receives-Volume-Purchase-Agreement-from-a-Leading-DRAM-Manufacturer-for-Metrology-Product-Suite), 2025-01-14: "The Iris G2 system offers a flexible, compelling cost of ownership metrology solution for ultra-thin multilayer films measuring 10Å to 50Å."

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Data from Endata (https://endata.com/). Announcements are summarized from public sources and may be incomplete; check the linked originals.